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High Voltage and Insulation Technology系列学术报告 (四) Gilbert Teyssèdre : Trap spectroscopies in polymer dielectrics


报告时间:2021111115:00-17:00

报告地点:腾讯会议Tencent Meeting

          会议ID:137 600 006

报告人: Gilbert Teyssèdre

工作单位法国国家科学研究中心CNRS

举办单位:BETVLCTOR伟德官方网站

报告人简介:

Gilbert Teyssèdre, born in 1966, received his Engineer degree in materials physics and graduated in solid state physics in 1989 at the INSA, Toulouse, France. Then he joined the Solid State Physics Lab in Toulouse and obtained the Ph.D. degree from Paul Sabatier University in 1993 for work on ferroelectric polymers. His research activities concern the development of luminescence techniques in insulating polymers with focus on chemical and physical structure, degradation phenomena, space charge and transport properties. He is currently Senior Researcher at CNRS. He has been head of the Solid Dielectrics and Reliability group at Laplace from 2004 to 2015. He has held numerous governmental and industrial research grants in the field of electrical insulation and has co-authored over 160 contributions to scientific journals and book chapters and 230 conference proceedings. He is member of the scientific committee of several conference series as CEIDP since 2016, ICD, ICEMPE, and JiCable. He is Associate Editor of IEEE Trans. Dielectr. Electr. Insul (2021-).

报告简介:

The electric properties of insulating materials, especially the conduction properties are strongly related to charges trapping. Depending on energy depth traps can assist transport or produce long lasting charge storage. One of the consequences of such phenomenon is space charge build, i.e. non-local neutrality, leading to a poor control of the electric field, and of non-linear macroscopic behaviour for conductivity. The important characteristics about traps are the origin of the levels, their depth in energy, and their density. In this presentation the different techniques available for approaching the characteristics of traps in insulating polymers will be discussed. It ranges from simulation based on known defects, identification by spectroscopic techniques, and coupled optical-electrical or thermal-electrical techniques to probe the energetics of traps.